Attaining semi-quantitative SERS measurements on thermally dewetted Au films
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: Advanced Device Materials
سال: 2017
ISSN: 2055-0308,2055-0316
DOI: 10.1080/20550308.2017.1372096